Response of M2 seedlings of sweet sorghum induced by carbon ion implantation to heat stress
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Response of M2 seedlings of sweet sorghum induced by carbon ion implantation to heat stress
Journal of Radiation Research and Radiation ProcessingVol. 26, Issue 5, Pages: 267-270(2008)
作者机构:
1.中国科学院近代物理研究所 兰州 730000
2.中国科学院研究生院 北京100049
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HE Jinyu, DONG Xicun, LI Wenjian, et al. Response of M2 seedlings of sweet sorghum induced by carbon ion implantation to heat stress. [J]. Journal of Radiation Research and Radiation Processing 26(5):267-270(2008)
DOI:
HE Jinyu, DONG Xicun, LI Wenjian, et al. Response of M2 seedlings of sweet sorghum induced by carbon ion implantation to heat stress. [J]. Journal of Radiation Research and Radiation Processing 26(5):267-270(2008)DOI:
Response of M2 seedlings of sweet sorghum induced by carbon ion implantation to heat stress
Sweet sorghum (,Sorghum bicolor, (L) Moench) seeds were implantated by carbon ion for different dose (0Gy, 10Gy, 30Gy, 50Gy, 80Gy) respectively, then plant height, biomass, contents of chlorophyll, malondialdehyde (MDA) and soluble sugar of M2 seedlings were measured in order to investigate the response of M2 seedlings to heat stress. The results show that plant height and chlorophyll content are changed unobviously among all treatments. Biomasses of M2 seedlings are higher after low dose (10Gy, 30Gy) of carbon ion implantation than that of high dose (50Gy, 80Gy) treatment, while the treatment of carbon ion implantation for 30Gy enhances the heat tolerance of M2 seedlings by decreasing the content of MDA and soluble sugar.