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Clustered DNA damages induced by low-energy (1~20 eV) electrons and the general mechanism of transient anions
RADIOBIOLOGY AND RADIOMEDICINE | 更新时间：2025-03-01
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    • Clustered DNA damages induced by low-energy (1~20 eV) electrons and the general mechanism of transient anions

    • “Under ultra-high vacuum conditions, low-energy electron irradiation of plasmid DNA reveals the relationship between quantum yield of DNA damage and electron energy, providing new insights into the mechanism of multiple DNA damage caused by ionizing radiation.”
    • Journal of Radiation Research and Radiation Processing   Vol. 39, Issue 4, Pages: 45-53(2021)

    • DOI：10.11889/j.1000-3436.2021.rrj.39.040305    

      CLC： Q3-3

    • Received：24 December 2020，

      Revised：03 February 2021，

      Accepted：2021-02-03，

      Published：20 August 2021

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  • ZHUANG Puxiang,DONG Yanfang,SHAO Yu,et al.Clustered DNA damages induced by low-energy (1~20 eV) electrons and the general mechanism of transient anions[J].Journal of Radiation Research and Radiation Processing,2021,39(04):45-53. DOI： 10.11889/j.1000-3436.2021.rrj.39.040305.

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