Mass thickness detection and verification for radiation processing products based on X-ray detection technology
RADIATION TECHNOLOGY APPLICATION|更新时间:2025-03-01
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Mass thickness detection and verification for radiation processing products based on X-ray detection technology
“In the field of product quality inspection, experts have developed a method for detecting the quality and thickness of products processed by electron beam irradiation, providing guidance for measuring product dose distribution and formulating irradiation process plans.”
Journal of Radiation Research and Radiation ProcessingVol. 39, Issue 4, Pages: 63-71(2021)
作者机构:
1.同威信达技术(北京)股份有限公司 北京100048
2.同方威视技术股份有限公司 北京 100084
作者简介:
LIU Yanqin (female) was born in October 1988, and obtained her master’s degree from Beijing University of Chemical Technology in July 2015, engaging in electron beam irradiation processing
LIU Yanqin,QIN Huaili,LIANG Aifeng,et al.Mass thickness detection and verification for radiation processing products based on X-ray detection technology[J].Journal of Radiation Research and Radiation Processing,2021,39(04):63-71.
LIU Yanqin,QIN Huaili,LIANG Aifeng,et al.Mass thickness detection and verification for radiation processing products based on X-ray detection technology[J].Journal of Radiation Research and Radiation Processing,2021,39(04):63-71. DOI: 10.11889/j.1000-3436.2021.rrj.39.040402.
Mass thickness detection and verification for radiation processing products based on X-ray detection technology