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Synergistic effect of total ionizing dose and single-event upset in the analog/digital converter AD574
RADIATION INTERDISCIPLINARY RESEARCH | 更新时间：2025-03-01
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    • Synergistic effect of total ionizing dose and single-event upset in the analog/digital converter AD574

    • “After accumulating 400 Gy (Si) ionizing dose under 60Co γ irradiation conditions, the output code value of the 12 bit analog-to-digital converter AD574 from Yadno Semiconductor Technology Co., Ltd. shifted to the right of the center code value and caused a change in the number of flips. Preliminary analysis suggests that this phenomenon is related to the sensitivity of the internal comparator of the analog/digital converter to single particle transients.”
    • Journal of Radiation Research and Radiation Processing   Vol. 39, Issue 4, Pages: 91-96(2021)

    • DOI：10.11889/j.1000-3436.2021.rrj.39.040702    

      CLC： O77+4;TN710.2

    • Received：18 January 2021，

      Revised：27 May 2021，

      Accepted：2021-05-27，

      Published：20 August 2021

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  • XIANG Chuanfeng,YAO Shuai,YU Xin,et al.Synergistic effect of total ionizing dose and single-event upset in the analog/digital converter AD574[J].Journal of Radiation Research and Radiation Processing,2021,39(04):91-96. DOI： 10.11889/j.1000-3436.2021.rrj.39.040702.

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