Bipolar linear devices laboratory irradiation testing results are significantly different from the actual in flight exposure to the radiation. In this paper the total dose irradiation of operational amplifiers, and analysis upon the total dose response of these bipolar circuits under the different test conditions were investigated in the same experiment. Total dose tests of bipolar linear operational amplifiers show susceptible to dose rate, bias and room temperature annealing during exposure. The critical sensitive parameters of operational amplifier are input bias current, input offset current, input offset voltage, and open loop gain, which exhibits both bias and dose rate dependence. With calculating the change of each electrical parameter (Δpara) for each sample at 300 Gy radiation level, it has been found that the ratio of the Δpara at low dose rate to the Δpara at high dose rate exceeds 2.46 times for any of the parameters. So these parts are considered to be ELDRS susceptible. After room temperature annealing, the main parameters have time dependent effect at low dose rate and without time dependent effect at high dose rate.