By the study of post-radiation and accelerate annealing in the total ionizing dose(TID), we find out that the additional 50% dose radiation and high temperature accelerate annealing (100℃ 168h) can not be skipped in the test because it is necessary to strictly check the memory’s TID effect in the space radiation environment. The analysis of device's discreteness in the test shows that parameters of device should be tested before the radiation to get their standard deviation. The high reliability of the memorizer which used in the satellite can be ensured by rejecting the device which increases the standard deviation. The TID test in the NASA report have been confirmed that the effectiveness of parameter test in 'read-only’, 'write’ and 'erase’ mode is better than the test in 'only read’ mode as it can reflect the degradation characteristics of the memorizer following ionizing radiation more reasonable. The test sequence applied for each memory at any electrical measurement steps after exposures annealing should be considered.