1.中国科学院长春应用化学研究所,长春
2.吉林化学工业公司研究院
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钟晓光, 张万喜, 张月芳, 等. 辐射交联聚砜的XPS研究[J]. 辐射研究与辐射工艺学报, 1988,6(1):58-60,F4.
Zhong Xiaoguang, Zhang Wanxi, Zhang Yunfang, et al. STUDIES ON RADIATION INDUCED CROSSLINKED POLYSULFONE BY XPS[J]. Journal of Radiation Research and Radiation Processing, 1988,6(1):58-60,F4.
利用X射线光电子能谱(XPS)研究了聚砜辐射交联前后结构的变化。结果表明,在较低温度下辐射交联的聚砜,其表征体系共轭程度强弱的振起峰(Shake up peak)相对强度降低,表明交联结构的形成破坏了聚砜分子的共轭体系。而高温下辐射交联的聚砜,其振起峰相对强度随辐射照剂量的增大而增强,说明形成了与低温时所不同的交联键结构。利用聚砜XPS谱图中,振起峰相对强度与辐照剂量的关系。求得了聚砜的凝胶化剂量。
Radiation induced crosslinked polysulfone was studied by means of X-rays photoelectron Spectroscopy(XPS). It was found that the relative intensity of the shake up peak of polysulfone irradiated at lower temperature decreased with the increase of dose, while that of polysulfone irradiated at higher temperature increased. with it. This showed the different crosslinking bond formed in polysulfone irradiated at different temperature. By XPS method we obtained the gelation dose of polysulone which was quite consistent with the value obtained from other method.
XPS振起峰聚砜的辐射交联辐射交联机理凝胶化剂量
XPS. Shake up peakThe crosslinking of polysulfongDose of gelation
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