1.暨南大学电子工程系 广州 510632
2.烟台师范学院物理系 烟台 264000
钟雨乐,男,1941年生,1964年毕业于西安交通大学应用物理专业,电子工程系教授
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钟雨乐, 黄君凯, 刘伟平, 等. 高能电子辐照导致氢化非晶硅的微晶化[J]. 辐射研究与辐射工艺学报, 2001,19(2):144-147.
ZHONG Yule, HUANG Junkai, LIU Weiping, et al. IRRADIATION OF ELECTRON WITH HIGH ENERGY INDUCED MICROCRYSTALLIZATION OF AMORPHOUS SILICON[J]. Journal of Radiation Research and Radiation Processing, 2001,19(2):144-147.
氢化非晶硅(a—Si:H)是无序硅网络中嵌入一定量H原子的非晶态硅—氢合金膜,结构上存在许多不稳定的弱Si—Si键及各种畸变键,在光、电老化过程中,它们会断裂或变形,导致缺陷态的增加,使材料性能变坏。a—Si:H微晶化后,这些缺点将得到有效的克服。结果发现,用0.3—0. 5MeV、注入束流密度1.3×10,19,cm,-2,s,-1,的高能电子辐照10—600s,a—Si:H膜会出现微晶化现象,晶粒大小为10—20nm,晶化层厚度为25—250nm。
Amorphous silicon is amorphous alloy of Si — H. It is random network of silicon with some hydrogen. And its structure has many unstable bonds as weak bonds of Si—Si and distortion bonds of all kinds. The bonds was broken or was out of shape by light and electrical ageing. It induced increase of defective state that causes character of material going to bad. This drawback will be overcome after microcrystallization of amorphous silicon. It was discovered that a—Si: H was microcrystallized by irradiated of electrons with energy of 0.3-0.5MeV, density of electronic beam of 1.3×10,19,cm,-1,s,-1, and irradiated time of 10—600s. Size of grain is 10—20nm. Thick of microcrystalline lager is 25—250nm.
高能电子辐照非晶硅微晶化
Irradiation of electron with high energyAmorphous siliconMicrocrystallization
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