X-RAY PHOTOELECTRON SPECTROSCOPY STUDY ON X-RAY INDUCED DEGRADATION OF BISPHENOL A POLYSULPHONE FILMS
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X-RAY PHOTOELECTRON SPECTROSCOPY STUDY ON X-RAY INDUCED DEGRADATION OF BISPHENOL A POLYSULPHONE FILMS
Journal of Radiation Research and Radiation ProcessingVol. 10, Issue 3, Pages: 187-189(1992)
作者机构:
1.山东非金属材料研究所,济南
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Ji Kejian, Zhang Yinsheng. X-RAY PHOTOELECTRON SPECTROSCOPY STUDY ON X-RAY INDUCED DEGRADATION OF BISPHENOL A POLYSULPHONE FILMS. [J]. Journal of Radiation Research and Radiation Processing 10(3):187-189(1992)
DOI:
Ji Kejian, Zhang Yinsheng. X-RAY PHOTOELECTRON SPECTROSCOPY STUDY ON X-RAY INDUCED DEGRADATION OF BISPHENOL A POLYSULPHONE FILMS. [J]. Journal of Radiation Research and Radiation Processing 10(3):187-189(1992)DOI:
X-RAY PHOTOELECTRON SPECTROSCOPY STUDY ON X-RAY INDUCED DEGRADATION OF BISPHENOL A POLYSULPHONE FILMS
The changes of surface composition of bisphenol A polysulphone films induced by X ray in ultrahigh vacuum have been studied using X ray photoelectron spectroscopy (XPS). The results show: (1) The sulphone group is partially changed into sulphide. (2) The extent of sulphide formation is dependent on irradiation time. (3) The degree of X ray induced degradation is basically uniform at the same irradiation time within the sampling depth.
关键词
X射线光电子能谱聚砜X射线辐照降解
Keywords
X ray photoelectron spectroscopyPolysulphoneX-rayradiationDegradation