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ZHONG Lei1; 2; YANG Changqiao1; TANG Zhongfeng1; WANG Mouhua1; HU Zhiqiang3; WU Guozhong1

doi:10.11889/j.1000-3436.2012.rrj.30.120603

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- Journal of Radiation Research and Radiation Processing Vol. 30, Issue 6, Pages: 333-338(2012)
- 作者机构：
  
  1. 1（中国科学院上海应用物理研究所）,上海,201800
  2. 2（浙江中科辐射高分子材料研发中心）,嘉兴,314100
  3. 3（浙江嘉善申嘉科技有限公司）,嘉兴,314100
- 作者简介：
- 基金信息：
- DOI：10.11889/j.1000-3436.2012.rrj.30.120603
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ZHONG Lei1, 2, YANG Changqiao1, et al. [J]. Journal of Radiation Research and Radiation Processing 30(6):333-338(2012)
DOI：

ZHONG Lei1, 2, YANG Changqiao1, et al. [J]. Journal of Radiation Research and Radiation Processing 30(6):333-338(2012) DOI： 10.11889/j.1000-3436.2012.rrj.30.120603.

摘要

与未交联聚四氟乙烯相比，交联聚四氟乙烯（XPTFE）具有耐磨性高、透明性好、熔点降低等特点。由于XPTFE在实际应用中可能需要经过高温加工成型或烧结工艺。因此，本工作重点研究了在340℃－400℃温度范围、空气气氛下XPTFE的热稳定性能，并与未交联PTFE在相同条件下的热稳定性进行了对比。研究发现，经过高温热处理后，XPTFE的熔点和结晶温度上升、分子量降低，且片材形变明显，表明XPTFE比常规PTFE的热稳定性低，而且交联度越高，热稳定性越低。综合考虑交联PTFE的耐温特性，认为PTFE的交联剂量控制在100 kGy以内较好。

Abstract

Radiation crosslinked polytetrafluoroethylene (XPTFE) has many properties compared to non-crosslinked PTFE, such as excellent friction resistance, better transparency and lower melting point, which may be applied for high temperature processing or sintering. In this paper the thermal stability of a series of XPTFE samples thermally treated over 340℃－400℃ in airwas investigated. It was found that melting point and crystallization temperature of XPTFE increased, meanwhile morphology deformation and decrement of molecular weight was also observed after thermal treatment. It indicates that the thermal stability of XPTFE becomes poorer along with the in-crement of the irradiation crosslinking dose. It can be suggested that the optimal dose for preparing XPTFE should be less than 100 kGy as the thermal stability of XPTFE is dependent on the crosslingking dose.Cited

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辐照交联交联聚四氟乙烯热稳定性

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1(Zhejiang Institute of Energy and Nuclear technology application, Hangzhou 310012, China) 2(Department of Polymer Science and Engineering, Zhejiang University,,)

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DOI：10.11889/j.1000-3436.2012.rrj.30.120603

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